- 3 magnetron sputtering sources.
- 1 inch target size.
- Excellent thin-film uniformity of less than ±3%.
- Multiple sources with sequential operation or co-deposition.
- RF, DC or pulsed-DC for non-conductive, conductive target, respectively.
- Substrate holder heating up to 800°C.
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- 3 evaporation sources(metal and organic).
- 1 inch target size.
- Excellent thin-film uniformity of less than ±3%.
- Multiple sources with sequential operation or co-deposition.
- Substrate holder heating up to 800°C.
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- SiOx, SiNx, a-Si Films.
- Excellent thin-film uniformity of less than ±3%.
- Substrate chuck heating up to 400°C by stable process temperatures control.
- Direct and remote capacitive coupled plasma (CCP).
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- Precursor Sources up to 2 precursors lines.
- Excellent thin-film uniformity of less than ±1%.
- CCP remote plasma.
- Substrate heater 500°C.
- Materials: Al2O3, HfO2, SiO2, TiO2, Ta2O5, ZnO, AZO, HfO2 , SiO2, TiO2, GaO2, AlN, SiN, Pt…
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- 13.56 MHz RF generator with automatic matching network delivers excellent process repeatability
- Excellent thin-film uniformity of less than ±3%.
- Mass flow controllers with highly uniform gas distribution up to 6 gas lines.
- Substrate cooling down to -20°C and heating up to 200°C.
- Materials: III-V compound semiconductors, metal, silicon, photo resist.
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- Top coil for ICP plasma and down power for RIE.
- Excellent thin-film uniformity of less than ±3%.
- Substrate cooling down to -20°C and heating up to 200°C.(option)
- Wafer clamping with helium backside cooling helps anisotropic etch.
- Materials: III-V compound semiconductors, metal, silicon, photo resist.
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